System spectrum conversion from white light interferogram.

نویسندگان

  • Risto Montonen
  • Anton Nolvi
  • Stanislav Tereschenko
  • Peter Kühnhold
  • Peter Lehmann
  • Edward Hæggström
  • Ivan Kassamakov
چکیده

Capability to simulate the coherence function is important when tuning an interference microscope in an effort to reduce sidelobes in interference signals. The coherence function cannot directly be derived from the light source spectrum since the microscope's effective spectrum is affected by e.g. spatial coherence effects. We show this by comparing the true system spectrum measured using a spectrometer against the effective system spectrum obtained by Fourier analysis of the interference data. The results show that a modulation function that describes the scattering-induced spatial coherence dampening in the system is needed to correct the observed difference between these two spectra. The validity of this modulation function is further verified by quantifying the arithmetic mean roughness of two specified roughness standards. By providing a spectral transfer function for scattering, our method can simulate a sample specific coherence function, and thus shows promise to increase the quality of interference microscope images.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Optical profiling using white light interference in spectral domain

The rapidly developing fields of Micro-Electro Mechanical System (MEMS) and micro optics require non contact and high precision measurements. Optical profilers are ideally suited for this. Monochromatic Phase Shifting Interferometry(PSI) can be used to measure slowly varying profiles and step height of less than half a wavelength. White light interferometry is used when large step height are to...

متن کامل

Digital holographic three-dimensional imaging spectrometry and depth imaging properties

We have studied a method to obtain both three-dimensional (3-D) spatial information and spectral information of a usual polychromatic object simultaneously by making use of a specifically designed two-wavefront folding interferometer and signal processing, including synthetic aperture technique, spectral decomposition, and 3-D image retrieval. The method uses only interferometric techniques and...

متن کامل

Optimal Characteristic of Optical Filter for White-Light Interferometry based on Sampling Theory

White-light interferometry is a technique of profiling surface topography of objects such as semiconductors, liquid crystal displays (LCDs), and so on. The world fastest surface profiling algorithm utilizes a generalized sampling theorem that reconstructs the squared-envelope function r(z) directly from an infinite number of samples of the interferogram f(z). In practical measurements, however,...

متن کامل

Measurement of the group-delay dispersion of femtosecond optics using white-light interferometry

A compact and practical white-light cross-correlator suitable for fast evaluation of femtosecond optics, in terms of group-delay dispersion, was developed. A 40-W tungsten-halogen lamp was used as a white-light source and the detector selection was made so as to have adequate spectral sensitivity from 600 to 1050 nm, peaked at 800 nm. Group-delay dispersion was obtained, with femtosecond time r...

متن کامل

The data processing of the temporarily and spatially mixed modulated polarization interference imaging spectrometer.

Based on the basic imaging theory of the temporally and spatially mixed modulated polarization interference imaging spectrometer (TSMPIIS), a method of interferogram obtaining and processing under polychromatic light is presented. Especially, instead of traditional Fourier transform spectroscopy, according to the unique imaging theory and OPD variation of TSMPIIS, the spectrum is reconstructed ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Optics express

دوره 25 11  شماره 

صفحات  -

تاریخ انتشار 2017